Mirouh Kamel

Thèmes de recherche

• ZnO doping and properties
• Thin-Film Transistor Technologies
• Chalcogenide Semiconductor Thin Films
• Advanced Materials and Semiconductor Technologies
• Semiconductor materials and interfaces
• Chemical and Physical Properties of Materials

Publications 40

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26. 超音波噴霧熱分解により作製したSnO_2薄膜の構造と光学特性に及ぼす膜厚の影響【JST・京大機械翻訳】 2018 · IEEE Conference Proceedings
27. Deposition temperature effects on optical and structural properties of amorphous silicon carbide films 2013 · International Journal of Nanotechnology · 4 citation(s)
28. Effect of defects introduced by temperature lowering and doping on the α-alumina toughness 2011 · Physics Procedia
29. Analogies between the mechanical and dielectric properties in the ceramic material type oxide 2008 · Materials Science and Engineering A · 3 citation(s)
30. CRYSTALLIZATION OF THIN AMORPHOUS SILICON LAYERS BY VARIOUS LASERS 2007 · Revue Sciences Humaines (Université des Frères Mentouri Constantine 1)
31. Effect of tungsten 0–8wt.% on the oxidation of Co–Cr alloys 2005 · Computational Materials Science · 26 citation(s)
32. Microstructural study of tungsten influence on Co–Cr alloys 2004 · Materials Science and Engineering A · 69 citation(s)
33. Effect of P+ ions on the microstructure and the nature of the formed silicides in the Cr/Si system 2004 · Materials Science and Engineering B · 1 citation(s)
34. EFFET DU TUNGSTÈNE 0-8wt. % SUR LA MICROSTRUCTURE DES ALLIAGES Co-Cr UTILISES DANS DES APPLICATIONS ODONTOLOGIQUES 2004 · Revue Sciences Humaines (Université des Frères Mentouri Constantine 1)
35. Microstructural study of annealed Cr/Si system using cross-sectional TEM combined with nano-analysis 2003 · Materials Science and Engineering B · 9 citation(s)
36. Silicidation in chromium–amorphous silicon multilayer films 2001 · Thin Solid Films · 5 citation(s)
37. Cross-sectional TEM investigations of the influence of P+ ions implanted in the Si substrate on the atomic interdiffusion in the Cr–Si system 2000 · Materials Science and Engineering B · 5 citation(s)
38. Conductivity of boron-implanted polycrystalline thin silicon films 1995 · Thin Solid Films · 5 citation(s)
39. Iron doped titanium nitride films 1995 · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
40. Effect of RF Power on the Microstructure of a-Si: H Films 1993 · physica status solidi (a) · 3 citation(s)